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- Author: Jenő Gubicza
- Publisher: Engineering Science Reference
- ISBN-10: 1466658525
- ISBN-13: 9781466658523
- Format: 17.8 x 25.4 x 2.1 cm, kieti viršeliai
- Language: English
- SAVE -10% with code: EXTRA
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Description
X-ray line profile analysis is an effective and non-destructive method for the characterization of the microstructure in crystalline materials. Supporting research in the area of x-ray line profile analysis is necessary in promoting further developments in this field. X-Ray Line Profile Analysis in Materials Science aims to synthesize the existing knowledge of the theory, methodology, and applications of x-ray line profile analysis in real-world settings. This publication presents both the theoretical background and practical implementation of x-ray line profile analysis and serves as a reference source for engineers in various disciplines as well as scholars and upper-level students.
EXTRA 10 % discount with code: EXTRA
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- Author: Jenő Gubicza
- Publisher: Engineering Science Reference
- ISBN-10: 1466658525
- ISBN-13: 9781466658523
- Format: 17.8 x 25.4 x 2.1 cm, kieti viršeliai
- Language: English English
X-ray line profile analysis is an effective and non-destructive method for the characterization of the microstructure in crystalline materials. Supporting research in the area of x-ray line profile analysis is necessary in promoting further developments in this field. X-Ray Line Profile Analysis in Materials Science aims to synthesize the existing knowledge of the theory, methodology, and applications of x-ray line profile analysis in real-world settings. This publication presents both the theoretical background and practical implementation of x-ray line profile analysis and serves as a reference source for engineers in various disciplines as well as scholars and upper-level students.
Reviews