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- Author: U S Department of Commerce
- Publisher: CreateSpace Independent Publishing Platform
- Year: 2014
- Pages: 36
- ISBN-10: 1494743973
- ISBN-13: 9781494743970
- Format: 17.8 x 25.4 x 0.2 cm, minkšti viršeliai
- Language: English
- SAVE -10% with code: EXTRA
Uncertainty Analysis For NIST Noise-Parameter Measurement (e-book) (used book) | bookbook.eu
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Description
Some time ago, what is now the Electromagnetics Division of the National Institute of Standards and Technology (NIST) developed the capability to measure noise parameters of amplifiers [1,2]. Recently, modified methods and analysis have been developed and have been applied both to amplifiers [3] and to transistors [4], the latter in an on-wafer environment. For such measurements to be meaningful, the results must be accompanied by corresponding uncertainties.
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- Author: U S Department of Commerce
- Publisher: CreateSpace Independent Publishing Platform
- Year: 2014
- Pages: 36
- ISBN-10: 1494743973
- ISBN-13: 9781494743970
- Format: 17.8 x 25.4 x 0.2 cm, minkšti viršeliai
- Language: English English
Some time ago, what is now the Electromagnetics Division of the National Institute of Standards and Technology (NIST) developed the capability to measure noise parameters of amplifiers [1,2]. Recently, modified methods and analysis have been developed and have been applied both to amplifiers [3] and to transistors [4], the latter in an on-wafer environment. For such measurements to be meaningful, the results must be accompanied by corresponding uncertainties.
Reviews