227,15 €
252,39 €
-10% with code: EXTRA
Test and Diagnosis for Small-Delay Defects
Test and Diagnosis for Small-Delay Defects
227,15
252,39 €
  • We will send in 10–14 business days.
This book will introduce new techniques for detecting and diagnosing small-delay defects in integrated circuits. Although this sort of timing defect is commonly found in integrated circuits manufactured with nanometer technology, this will be the first book to introduce effective and scalable methodologies for screening and diagnosing small-delay defects, including important parameters such as process variations, crosstalk, and power supply noise.
  • Publisher:
  • ISBN-10: 1441982965
  • ISBN-13: 9781441982964
  • Format: 15.6 x 23.4 x 1.4 cm, kieti viršeliai
  • Language: English
  • SAVE -10% with code: EXTRA

Test and Diagnosis for Small-Delay Defects (e-book) (used book) | bookbook.eu

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This book will introduce new techniques for detecting and diagnosing small-delay defects in integrated circuits. Although this sort of timing defect is commonly found in integrated circuits manufactured with nanometer technology, this will be the first book to introduce effective and scalable methodologies for screening and diagnosing small-delay defects, including important parameters such as process variations, crosstalk, and power supply noise.

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  • Author: Mohammad Tehranipoor
  • Publisher:
  • ISBN-10: 1441982965
  • ISBN-13: 9781441982964
  • Format: 15.6 x 23.4 x 1.4 cm, kieti viršeliai
  • Language: English English

This book will introduce new techniques for detecting and diagnosing small-delay defects in integrated circuits. Although this sort of timing defect is commonly found in integrated circuits manufactured with nanometer technology, this will be the first book to introduce effective and scalable methodologies for screening and diagnosing small-delay defects, including important parameters such as process variations, crosstalk, and power supply noise.

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