- We will send in 10–14 business days.
/images/books/11375540/9781606507278.jpg)
- Author: Harland G Tompkins
- Publisher: Momentum Press
- ISBN-10: 1606507273
- ISBN-13: 9781606507278
- Format: 15.2 x 22.9 x 1 cm, minkšti viršeliai
- Language: English
- SAVE -10% with code: EXTRA
Reviews
Description
Ellipsometry is an experimental technique for determining the thickness and optical properties of thin films. It is ideally suited for films ranging in thickness from sub-nanometer to several microns. Spectroscopic measurements have greatly expanded the capabilities of this technique and introduced its use into all areas where thin films are found: semiconductor devices, flat panel and mobile displays, optical coating stacks, biological and medical coatings, protective layers, and more. While several scholarly books exist on the topic, this book provides a good introduction to the basic theory of the technique and its common applications. The target audience is not the ellipsometry scholar, but process engineers and students of materials science who are experts in their own fields and wish to use ellipsometry to measure thin film properties without becoming an expert in ellipsometry itself.
EXTRA 10 % discount with code: EXTRA
The promotion ends in 21d.05:41:09
The discount code is valid when purchasing from 10 €. Discounts do not stack.
- Author: Harland G Tompkins
- Publisher: Momentum Press
- ISBN-10: 1606507273
- ISBN-13: 9781606507278
- Format: 15.2 x 22.9 x 1 cm, minkšti viršeliai
- Language: English English
Ellipsometry is an experimental technique for determining the thickness and optical properties of thin films. It is ideally suited for films ranging in thickness from sub-nanometer to several microns. Spectroscopic measurements have greatly expanded the capabilities of this technique and introduced its use into all areas where thin films are found: semiconductor devices, flat panel and mobile displays, optical coating stacks, biological and medical coatings, protective layers, and more. While several scholarly books exist on the topic, this book provides a good introduction to the basic theory of the technique and its common applications. The target audience is not the ellipsometry scholar, but process engineers and students of materials science who are experts in their own fields and wish to use ellipsometry to measure thin film properties without becoming an expert in ellipsometry itself.
Reviews