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- Author: Nobuo Tanaka
- Publisher: Imperial College Press
- Year: 2014
- Pages: 616
- ISBN-10: 184816789X
- ISBN-13: 9781848167896
- Format: 15.5 x 22.9 x 3.3 cm, hardcover
- Language: English
- SAVE -10% with code: EXTRA
Scanning Transmission Electron Microscopy of Nanomaterials: Basics of Imaging and Analysis (e-book) (used book) | bookbook.eu
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Description
The basics, present status and future prospects of high-resolution scanning transmission electron microscopy (STEM) are described in the form of a textbook for advanced undergraduates and graduate students. This volume covers recent achievements in the field of STEM obtained with advanced technologies such as spherical aberration correction, monochromator, high-sensitivity electron energy loss spectroscopy and the software of image mapping. The future prospects chapter also deals with z-slice imaging and confocal STEM for 3D analysis of nanostructured materials.
EXTRA 10 % discount with code: EXTRA
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- Author: Nobuo Tanaka
- Publisher: Imperial College Press
- Year: 2014
- Pages: 616
- ISBN-10: 184816789X
- ISBN-13: 9781848167896
- Format: 15.5 x 22.9 x 3.3 cm, hardcover
- Language: English English
The basics, present status and future prospects of high-resolution scanning transmission electron microscopy (STEM) are described in the form of a textbook for advanced undergraduates and graduate students. This volume covers recent achievements in the field of STEM obtained with advanced technologies such as spherical aberration correction, monochromator, high-sensitivity electron energy loss spectroscopy and the software of image mapping. The future prospects chapter also deals with z-slice imaging and confocal STEM for 3D analysis of nanostructured materials.
Reviews