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- Publisher: IntechOpen
- ISBN-10: 1839682299
- ISBN-13: 9781839682292
- Format: 17 x 24.4 x 1.8 cm, hardcover
- Language: English
- SAVE -10% with code: EXTRA
Recent Developments in Atomic Force Microscopy and Raman Spectroscopy for Materials Characterization (e-book) (used book) | bookbook.eu
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Description
This book contains chapters that describe advanced atomic force microscopy (AFM) modes and Raman spectroscopy. It also provides an in-depth understanding of advanced AFM modes and Raman spectroscopy for characterizing various materials. This volume is a useful resource for a wide range of readers, including scientists, engineers, graduate students, postdoctoral fellows, and scientific professionals working in specialized fields such as AFM, photovoltaics, 2D materials, carbon nanotubes, nanomaterials, and Raman spectroscopy.
EXTRA 10 % discount with code: EXTRA
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- Publisher: IntechOpen
- ISBN-10: 1839682299
- ISBN-13: 9781839682292
- Format: 17 x 24.4 x 1.8 cm, hardcover
- Language: English English
This book contains chapters that describe advanced atomic force microscopy (AFM) modes and Raman spectroscopy. It also provides an in-depth understanding of advanced AFM modes and Raman spectroscopy for characterizing various materials. This volume is a useful resource for a wide range of readers, including scientists, engineers, graduate students, postdoctoral fellows, and scientific professionals working in specialized fields such as AFM, photovoltaics, 2D materials, carbon nanotubes, nanomaterials, and Raman spectroscopy.
Reviews