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- Author: U S Department of Commerce
- Publisher: CreateSpace Independent Publishing Platform
- Year: 2010
- Pages: 466
- ISBN-10: 1452800480
- ISBN-13: 9781452800486
- Format: 19.1 x 23.5 x 2.4 cm, minkšti viršeliai
- Language: English
- SAVE -10% with code: EXTRA
Manual of Patent Examining Procedure (Vol.2) (e-book) (used book) | bookbook.eu
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Description
New 9th Edition is available (ISBN: 978-1500927530). This is Original 8th Edition (Rev, July 2008) Manual of Patent Examining Procedure (a.k.a. MPEP) (A work in 7 volumes) This Manual is published to provide U.S. Patent and Trademark Office (USPTO) patent examiners, applicants, attorneys, agents, and representatives of applicants with a reference work on the practices and procedures relative to the prosecution of patent applications before the USPTO. It contains instructions to examiners, as well as other material in the nature of information and interpretation, and outlines the current procedures which the examiners are required or authorized to follow in appropriate cases in the normal examination of a patent application. Kentaro Sato (Editor)
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- Author: U S Department of Commerce
- Publisher: CreateSpace Independent Publishing Platform
- Year: 2010
- Pages: 466
- ISBN-10: 1452800480
- ISBN-13: 9781452800486
- Format: 19.1 x 23.5 x 2.4 cm, minkšti viršeliai
- Language: English English
New 9th Edition is available (ISBN: 978-1500927530). This is Original 8th Edition (Rev, July 2008) Manual of Patent Examining Procedure (a.k.a. MPEP) (A work in 7 volumes) This Manual is published to provide U.S. Patent and Trademark Office (USPTO) patent examiners, applicants, attorneys, agents, and representatives of applicants with a reference work on the practices and procedures relative to the prosecution of patent applications before the USPTO. It contains instructions to examiners, as well as other material in the nature of information and interpretation, and outlines the current procedures which the examiners are required or authorized to follow in appropriate cases in the normal examination of a patent application. Kentaro Sato (Editor)
Reviews