211,22 €
234,69 €
-10% with code: EXTRA
Introduction to Focused Ion Beam Nanometrology
211,22 € 
- We will send in 10–14 business days.
This book describes modern focused ion beam microscopes and techniques and how they can be used to aid materials metrology and as tools for the fabrication of devices that in turn are used in many other aspects of fundamental metrology.
234.69
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- Author: David C Cox
- Publisher: MORGAN & CLAYPOOL
- Year: 2015
- Pages: 84
- ISBN-10: 1681740206
- ISBN-13: 9781681740201
- Format: 17.8 x 25.4 x 0.4 cm, minkšti viršeliai
- Language: English
- SAVE -10% with code: EXTRA
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Description
This book describes modern focused ion beam microscopes and techniques and how they can be used to aid materials metrology and as tools for the fabrication of devices that in turn are used in many other aspects of fundamental metrology.
EXTRA 10 % discount with code: EXTRA
211,22 €
234,69 €
We will send in 10–14 business days.
The promotion ends in 23d.05:16:10
The discount code is valid when purchasing from 10 €. Discounts do not stack.
- Author: David C Cox
- Publisher: MORGAN & CLAYPOOL
- Year: 2015
- Pages: 84
- ISBN-10: 1681740206
- ISBN-13: 9781681740201
- Format: 17.8 x 25.4 x 0.4 cm, minkšti viršeliai
- Language: English English
This book describes modern focused ion beam microscopes and techniques and how they can be used to aid materials metrology and as tools for the fabrication of devices that in turn are used in many other aspects of fundamental metrology.
Reviews