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- Author: Zeeshan Ahmed
- Publisher: VDM Verlag
- ISBN-10: 3639325532
- ISBN-13: 9783639325539
- Format: 15.2 x 22.9 x 0.7 cm, softcover
- Language: English
- SAVE -10% with code: EXTRA
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Description
This research proposes a solution to manage variabilities of software product line applications. The objective of the research is to support software decision makers in handling additional software complexity introduced by product line architectures. In order to fulfill this objective an approach to analyze, visualize, and measure product line specific characteristics of the C/C++ source code are proposed. The approach is validated in an empirical experiment using an open source software system. For that purpose the approach is first implemented into M-System-NT, an existing software measurement tool developed at Fraunhofer Institute for Experimental Software engineering. The target hypothesis of the research master thesis to perform static analysis of C/C++ source code, measure traditional and product line measures to identify the correlation between measures and indicate the fault proneness.
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- Author: Zeeshan Ahmed
- Publisher: VDM Verlag
- ISBN-10: 3639325532
- ISBN-13: 9783639325539
- Format: 15.2 x 22.9 x 0.7 cm, softcover
- Language: English English
This research proposes a solution to manage variabilities of software product line applications. The objective of the research is to support software decision makers in handling additional software complexity introduced by product line architectures. In order to fulfill this objective an approach to analyze, visualize, and measure product line specific characteristics of the C/C++ source code are proposed. The approach is validated in an empirical experiment using an open source software system. For that purpose the approach is first implemented into M-System-NT, an existing software measurement tool developed at Fraunhofer Institute for Experimental Software engineering. The target hypothesis of the research master thesis to perform static analysis of C/C++ source code, measure traditional and product line measures to identify the correlation between measures and indicate the fault proneness.
Reviews