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- Author: Zheng Wang
- Publisher: Springer
- ISBN-10: 9811093210
- ISBN-13: 9789811093210
- Format: 15.6 x 23.4 x 1.2 cm, minkšti viršeliai
- Language: English
- SAVE -10% with code: EXTRA
High-Level Estimation and Exploration of Reliability for Multi-Processor System-On-Chip (e-book) (used book) | bookbook.eu
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This book introduces a novel framework for accurately modeling the errors in nanoscale CMOS technology and developing a smooth tool flow at high-level design abstractions to estimate and mitigate the effects of errors. The book presents novel techniques for high-level fault simulation and reliability estimation as well as architecture-level and system-level fault tolerant designs. It also presents a survey of state-of-the-art problems and solutions, offering insights into reliability issues in digital design and their cross-layer countermeasures.
EXTRA 10 % discount with code: EXTRA
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- Author: Zheng Wang
- Publisher: Springer
- ISBN-10: 9811093210
- ISBN-13: 9789811093210
- Format: 15.6 x 23.4 x 1.2 cm, minkšti viršeliai
- Language: English English
This book introduces a novel framework for accurately modeling the errors in nanoscale CMOS technology and developing a smooth tool flow at high-level design abstractions to estimate and mitigate the effects of errors. The book presents novel techniques for high-level fault simulation and reliability estimation as well as architecture-level and system-level fault tolerant designs. It also presents a survey of state-of-the-art problems and solutions, offering insights into reliability issues in digital design and their cross-layer countermeasures.
Reviews