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- Author: Sofie Burger
- Publisher: Karlsruher Institut für Technologie
- ISBN-10: 3731500256
- ISBN-13: 9783731500254
- Format: 14.8 x 21 x 0.9 cm, minkšti viršeliai
- Language: English
- SAVE -10% with code: EXTRA
High Cycle Fatigue of Al and Cu Thin Films by a Novel High-Throughput Method (e-book) (used book) | bookbook.eu
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In the last two decades, the reliability of small electronic devices used in automotive or consumer electronics gained researchers attention. Thus, there is the need to understand the fatigue properties and damage mechanisms of thin films. In this thesis a novel high-throughput testing method for thin films on Si substrate is presented. The specialty of this method is to test one sample at different strain amplitudes at the same time and measure an entire lifetime curve with only one experiment.
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- Author: Sofie Burger
- Publisher: Karlsruher Institut für Technologie
- ISBN-10: 3731500256
- ISBN-13: 9783731500254
- Format: 14.8 x 21 x 0.9 cm, minkšti viršeliai
- Language: English English
In the last two decades, the reliability of small electronic devices used in automotive or consumer electronics gained researchers attention. Thus, there is the need to understand the fatigue properties and damage mechanisms of thin films. In this thesis a novel high-throughput testing method for thin films on Si substrate is presented. The specialty of this method is to test one sample at different strain amplitudes at the same time and measure an entire lifetime curve with only one experiment.
Reviews