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- Author: L A Aslanov
- Publisher: Intl Union of Crystallography
- ISBN-10: 0198559275
- ISBN-13: 9780198559276
- Format: 15.6 x 23.4 x 1.9 cm, hardcover
- Language: English
- SAVE -10% with code: EXTRA
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Description
Innovations in crystallographic instrumentation and the rapid development of methods of diffraction measurement have led to a vast improvement in our ability to determine crystal and molecular structure. This up-to-date resource will allow the reader to harness the potential of X-ray diffraction instruments. Different sources of X-radiation used in crystallography are introduced, including synchrotron radiation, as well as a systematic review of detectors for X-rays and basic instruments for single crystal and powder diffractometry. The principles of the diffraction experiment are discussed and related to their practical application with a comparative description of different scan procedures. Diffraction data collection and processing are also reviewed and methods for error correction are described. This book will provide a useful guide for researchers and students starting in this area of science, as well as skilled crystallographers.
EXTRA 10 % discount with code: EXTRA
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- Author: L A Aslanov
- Publisher: Intl Union of Crystallography
- ISBN-10: 0198559275
- ISBN-13: 9780198559276
- Format: 15.6 x 23.4 x 1.9 cm, hardcover
- Language: English English
Innovations in crystallographic instrumentation and the rapid development of methods of diffraction measurement have led to a vast improvement in our ability to determine crystal and molecular structure. This up-to-date resource will allow the reader to harness the potential of X-ray diffraction instruments. Different sources of X-radiation used in crystallography are introduced, including synchrotron radiation, as well as a systematic review of detectors for X-rays and basic instruments for single crystal and powder diffractometry. The principles of the diffraction experiment are discussed and related to their practical application with a comparative description of different scan procedures. Diffraction data collection and processing are also reviewed and methods for error correction are described. This book will provide a useful guide for researchers and students starting in this area of science, as well as skilled crystallographers.
Reviews