- We will send in 10–14 business days.
/images/books/3013785/9780306442490.jpg)
- Publisher: Springer
- ISBN-10: 0306442493
- ISBN-13: 9780306442490
- Format: 17 x 24.4 x 3.5 cm, hardcover
- Language: English
- SAVE -10% with code: EXTRA
Advances in X-Ray Analysis (e-book) (used book) | bookbook.eu
Reviews
Description
Whole Pattern Fitting, Rietveld Analysis, and Calculated Diffraction Patterns. Quantitative Phase Analysis by XRay Diffraction (XRD). Thin Film and Surface Characterization by XRD. Lattice Defects and XRay Topography. Texture Analysis by XRD. XRD Instrumentation, Techniques, and Reference Materials. Stress Determination by Diffraction Methods. XRD Profile Fitting, Crystallite Size and Strain Determination. XRD Applications: Detection Limits, Superconductors, Organics, Minerals. Mathematical Methods in XRay Spectrometry (XRS). Thin Film and Surface Characterization by XRS and XPS. Total Reflection XRS. XRS Techniques and Instrumentation. XRS Applications. XRay Imaging and Tomography. 161 articles. Index.
EXTRA 10 % discount with code: EXTRA
The promotion ends in 16d.15:28:12
The discount code is valid when purchasing from 10 €. Discounts do not stack.
- Publisher: Springer
- ISBN-10: 0306442493
- ISBN-13: 9780306442490
- Format: 17 x 24.4 x 3.5 cm, hardcover
- Language: English English
Whole Pattern Fitting, Rietveld Analysis, and Calculated Diffraction Patterns. Quantitative Phase Analysis by XRay Diffraction (XRD). Thin Film and Surface Characterization by XRD. Lattice Defects and XRay Topography. Texture Analysis by XRD. XRD Instrumentation, Techniques, and Reference Materials. Stress Determination by Diffraction Methods. XRD Profile Fitting, Crystallite Size and Strain Determination. XRD Applications: Detection Limits, Superconductors, Organics, Minerals. Mathematical Methods in XRay Spectrometry (XRS). Thin Film and Surface Characterization by XRS and XPS. Total Reflection XRS. XRS Techniques and Instrumentation. XRS Applications. XRay Imaging and Tomography. 161 articles. Index.
Reviews