283,13 €
314,59 €
-10% with code: EXTRA
Advanced Laser Diode Reliability
283,13 € 
- We will send in 10–14 business days.
Advanced Laser Diode Reliability focuses on causes and effects of degradations of state-of-the-art semiconductor laser diodes. It aims to provide a tool for linking practical measurements to physical diagnostics. To this purpose, it reviews the current technologies, addressing their peculiar details that can promote specific failure mechanisms. Two sections will support this kernel: a) Failure Analysis techniques, procedures and examples; b) Device-oriented laser modelling and parameter extract…
314.59
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- Author: Massimo Vanzi
- Publisher: ISTE Press - Elsevier
- Year: 2021
- Pages: 200
- ISBN-10: 1785481541
- ISBN-13: 9781785481543
- Format: 15.2 x 22.9 x 1.6 cm, kieti viršeliai
- Language: English
- SAVE -10% with code: EXTRA
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Description
Advanced Laser Diode Reliability focuses on causes and effects of degradations of state-of-the-art semiconductor laser diodes. It aims to provide a tool for linking practical measurements to physical diagnostics. To this purpose, it reviews the current technologies, addressing their peculiar details that can promote specific failure mechanisms. Two sections will support this kernel: a) Failure Analysis techniques, procedures and examples; b) Device-oriented laser modelling and parameter extraction.EXTRA 10 % discount with code: EXTRA
283,13 €
314,59 €
We will send in 10–14 business days.
The promotion ends in 23d.15:39:48
The discount code is valid when purchasing from 10 €. Discounts do not stack.
- Author: Massimo Vanzi
- Publisher: ISTE Press - Elsevier
- Year: 2021
- Pages: 200
- ISBN-10: 1785481541
- ISBN-13: 9781785481543
- Format: 15.2 x 22.9 x 1.6 cm, kieti viršeliai
- Language: English English
Advanced Laser Diode Reliability focuses on causes and effects of degradations of state-of-the-art semiconductor laser diodes. It aims to provide a tool for linking practical measurements to physical diagnostics. To this purpose, it reviews the current technologies, addressing their peculiar details that can promote specific failure mechanisms. Two sections will support this kernel: a) Failure Analysis techniques, procedures and examples; b) Device-oriented laser modelling and parameter extraction.
Reviews