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- Author: U S Department of Commerce
- Publisher: CreateSpace Independent Publishing Platform
- Year: 2014
- Pages: 54
- ISBN-10: 149474385X
- ISBN-13: 9781494743857
- Format: 21.6 x 28 x 0.3 cm, minkšti viršeliai
- Language: English
- SAVE -10% with code: EXTRA
A Next Generation Sampling Comparator Probe for the NIST Sampling Waveform Analyzer (e-book) (used book) | bookbook.eu
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Description
The design and performance of a Next Generation Sampling Comparator Probe (NGSCP) is described. It is intended as one of a group of probes designed for use with the NIST Sampling Waveform Analyzer (SWA). The probe design is centered on an application specific integrated circuit (ASIC) analog comparator featuring a bandwidth of 6 GHz. The design considerations of the ASIC analog comparator and the probe are discussed. The probe's performance features are compared against a previously designed ASIC probe. In addition to the design aspects of the probe, a thermal error correction technique is described which shows how high-speed settling performance can be enhanced. This technical note provides complete schematic diagrams of the ASIC comparator and the probe.
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- Author: U S Department of Commerce
- Publisher: CreateSpace Independent Publishing Platform
- Year: 2014
- Pages: 54
- ISBN-10: 149474385X
- ISBN-13: 9781494743857
- Format: 21.6 x 28 x 0.3 cm, minkšti viršeliai
- Language: English English
The design and performance of a Next Generation Sampling Comparator Probe (NGSCP) is described. It is intended as one of a group of probes designed for use with the NIST Sampling Waveform Analyzer (SWA). The probe design is centered on an application specific integrated circuit (ASIC) analog comparator featuring a bandwidth of 6 GHz. The design considerations of the ASIC analog comparator and the probe are discussed. The probe's performance features are compared against a previously designed ASIC probe. In addition to the design aspects of the probe, a thermal error correction technique is described which shows how high-speed settling performance can be enhanced. This technical note provides complete schematic diagrams of the ASIC comparator and the probe.
Reviews